MetaPULSE system measurements of UBM and RDL on product wafers displace monitor wafer methodology as pattern-dependent deposition effects become significant Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor, LED and solar industries, announced today that it has delivered the first ...

Fab-tool vendor KLA-Tencor has announced the availability of its latest wafer defect inspection systems, and is shipping the products to its clients in the foundry, logic and memory IC fields.

People describe innovation as thinking “outside the box.” However, that may not always work in a complex manufacturing environment.